Reconfiguring fault-tolerant two-dimensional array architectures |
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Authors: | Davis N.J. IV Gray F.G. Wegner J.A. Lawson S.E. Murthy V. White T.S. |
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Affiliation: | Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA; |
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Abstract: | ![]() Circuit complexities reduce overall reliability and mean-time-between-failure rates of today's very large processing arrays. Our integrated, three-level hierarchy of reconfiguration methods provides reasonable levels of fault tolerance for such systems. Operating in a completely distributed fashion, the hierarchy does not require that any components be fault free. It significantly improves array reliability by using a combination of transient fault rollback techniques and local and global reconfiguration algorithms |
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