Measurement and Identification of the Parameters of SPICE-Models of a Bipolar Transistor |
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| Authors: | V N Petrov M N Petrov S A Kapralov |
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| Affiliation: | (1) Chair for Electron Devices and Integrated Circuits (CEDIC), University of Technology Dresden, Dresden, Germany;(2) ECE Dept, University of California at San Diego, La Jolla, USA;(3) XMOD Technologies Inc., Bordeaux, France |
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| Abstract: | A method of measuring and identifying the static parameters of a bipolar transistor is considered. The characteristic of the transistor, from which the parameters of the model are determined, is chosen depending on what group the calculated parameters belong to. The characteristics are measured in such a way that the equations of the model describing them can be reduced to the simplest form. |
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| Keywords: | bipolar transistor measurement of the characteristics SPICE-model identification of the static parameters |
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