首页 | 本学科首页   官方微博 | 高级检索  
     

基于内建自测技术的Mesh结构NoC无虚通道容错路由算法
引用本文:姚磊,蔡觉平,李赞,张海林,王韶力.基于内建自测技术的Mesh结构NoC无虚通道容错路由算法[J].电子学报,2012,40(5):983-989.
作者姓名:姚磊  蔡觉平  李赞  张海林  王韶力
作者单位:1. 西安电子科技大学综合业务网国家重点实验室,陕西西安,710071
2. 宽带隙半导体国家重点实验室,陕西西安,710071
基金项目:国家新一代宽带无线移动通信网科技重大专项,高等学校学科创新引智计划,国家自然科学基金
摘    要: 在Zhang's算法绕行思想的基础上,提出了一种2D-Mesh结构片上网络无虚通道容错路由算法,用于解决多故障节点情况下片上网络的无虚通道容错路由问题.算法利用内建自测试机制获取故障区域的位置信息,通过优化绕行策略来均衡故障区域周围链路的负载并减少部分数据的绕行距离.针对8×8的2D-Mesh网络的仿真表明,与Chen's算法相比,在故障区域大小为2×2,网络时延为70 cycles的情况下,随着故障区域位置的变化所提算法可提高1.2%到4.8%的网络注入率.且随着故障区域面积的扩大,所提算法在减少通信时延,提高网络吞吐量方面的作用更为明显.

关 键 词:容错  片上网络  虚通道  内建自测
收稿时间:2011-08-29

A Fault-Tolerant Routing Algorithm Based on BIST for 2D-Mesh Network-on-Chip without Using Virtual Channels
YAO Lei , CAI Jue-ping , LI Zan , ZHANG Hai-lin , WANG Shao-Li.A Fault-Tolerant Routing Algorithm Based on BIST for 2D-Mesh Network-on-Chip without Using Virtual Channels[J].Acta Electronica Sinica,2012,40(5):983-989.
Authors:YAO Lei  CAI Jue-ping  LI Zan  ZHANG Hai-lin  WANG Shao-Li
Affiliation:1.Wide Bandgap Semiconductor Technology Disciplines State Key Laboratory,Xi’an,Shaanxi 710071,China;2.State Key Laboratory of ISN,Xidian University,Xi’an,Shaanxi 710071,China)
Abstract:To solve fault-tolerant problem in 2D-Mesh Network-on-Chip(NoC) with more than one fault node,a novel fault-tolerant routing algorithm without virtual channels is proposed on the basis of Zhang’s algorithm.The algorithm use Built-in Self Test(BIST) mechanism to get fault nodes’ location information.Then,by optimizing the fault-tolerant strategy,the traffic loads on the boundaries of fault region can be balanced and the transmission distance of the packets routing around the faults is shortened.Simulation results in 8×8 2D-Mesh NoC show that,as the change of fault block in position,the proposed algorithm can improve network injection rate by 1.2% to 4.8% compared to Chen’s algorithm when the fault region is 2×2,network latency is 70 cycles.Moreover,with the increase in area of the fault region,proposed algorithm provides a better performance in reducing communication latency and increasing network throughput.
Keywords:fault tolerance  network-on-chip(NoC)  virtual channels  built-in self test(BIST)
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《电子学报》浏览原始摘要信息
点击此处可从《电子学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号