Applied multiresolution analysis to infrared images for defects detection in materials |
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| Affiliation: | 1. University Mohammed V of Rabat, EST- LASTIMI, Salé, B.P. 227, Salé-Medina, Morocco;2. University Mohammed V of Rabat, EST- LEME, Salé, B.P. 227, Salé-Medina, Morocco;3. University Mohammed V of Rabat, Faculty of Sciences, UFR-ATI, BP 1014, Rabat, Morocco;1. Department of Mechanical Engineering, Villanova University, Villanova, PA 19085, USA;2. Department of Electrical and Computer Engineering, Temple University, Philadelphia, PA 19122, USA;3. Center for Advanced Communications, College of Engineering, Villanova University, Villanova, PA 19085, USA;1. Laboratoire d’Imagerie Biomédicale, UPMC, INSERM, CNRS, 15 rue de l’école de médecine, 75006 Paris, France;2. Institut Langevin, 1 rue Jussieu, 75005 Paris, France;1. Department of Physics, University of Warwick, Coventry, CV4 7AL, UK;2. Department of Mechanical Engineering, Imperial College London, London, SW7 2AZ, UK;3. Department of Aerospace Engineering & Engineering Mechanics, University of Cincinnati, Cincinnati, OH 45221, USA;1. College of Surveying and Geo-informatics, Tongji University, 1239 Siping Road, 200092, Shanghai, China;2. School of Ocean and Earth Science, Tongji University, 1239 Siping Road, 200092, Shanghai, China |
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| Abstract: | In this paper, an advanced approach to characterize defects in homogeneous materials based on multiresolution analysis of infrared images is presented. This is mainly a non-destructive evaluation technique based on the flash method in transmission mode. An experimental device using infrared thermography was designed and realized. The equipment includes an infrared imager for following the temporal evolution of the temperature in the rear face of the tested sample. The other front face receives a flash from a halogen lamps excitation source. The thermal images generated at the rear face are segmented using a wavelet transform multiresolution analysis in order to extract all defects zones and subsequently processed to estimate their corresponding surface sizes. The experimental results on the test materials with hidden defects show the advantage of the segmentation technique applied to the response images of the system. High precision of the localization and accurate estimation of the surface sizes of the detected defects are achieved with the advanced method, involving a denoising of the images using a thresholding of wavelet coefficients. The outcome is a significantly improved detection quality, due mainly to the advanced processing, which does not depend on the type, shape and size of the defects. |
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| Keywords: | Defect detection Flash method Infrared images Segmentation Multiresolution analysis |
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