| 基于边缘扫描技术的PCB测试节点优化设计 |
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| 引用本文： | 雷勇,谢永乐,陈光.基于边缘扫描技术的PCB测试节点优化设计[J].电子测量与仪器学报,2009,23(10):80-84. |
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| 作者姓名： | 雷勇 谢永乐 陈光 |
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| 作者单位： | 电子科技大学自动化学院,成都,610054 |
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| 基金项目： | 国家自然科学基金项目 |
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| 摘 要： | 介绍了一种可用于PCB测试的方法。边缘扫描技术是一种先进的数字电路测试技术,可广泛应用于大规模集成电路的测试。本文详细介绍了边缘扫描技术的测试电路结构及其工作模式,并将其应用于PCB的测试,本文利用基于贪婪策略的最优化算法分析了PCB的测试节点,可以利用最小的测试节点集实现PCB的测试。实际应用电路的分析结果表明,本文介绍的PCB测试方法,可以有效地降低PCB级测试的硬件开销。
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| 关 键 词： | 边缘扫描技术 IC测试模式 PCB测试模式 |
Optimised design of PCB test nodes based on boundary-scan technology |
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| Lei Yong Xie Yongle Chen Guang.Optimised design of PCB test nodes based on boundary-scan technology[J].Journal of Electronic Measurement and Instrument,2009,23(10):80-84. |
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| Authors: | Lei Yong Xie Yongle Chen Guang |
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| Affiliation: | Lei Yong Xie Yongle Chen Guangju (University of Electronic Science and Technology of China, Chengdu 610054, China) |
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| Abstract: | The paper presents a PCB test method. Boundary scan technology is an advanced test technology for digital circuit, and it is widely used for testing LSI integrated circuit. The paper presents test architecture and test mode of boundary scan technology, then it is applied for PCB test. The paper analyzes the test nodes of PCB boards with optimized algorithm of greedy strategy algorithm, so the PCB board can be test with minimal test nodes set. Analysis results of experimental circuit indicated that hardware cost can be lowered during PCB test with the method presented in the paper. |
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| Keywords: | boundary scan technology IC test model PCB test model |
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