p-AgCoO2/n-ZnO heterojunction diode grown by rf magnetron sputtering

P-type transparent semiconducting AgCoO₂ thin films were deposited by rf magnetron sputtering of sintered AgCoO₂ target. The AgCoO₂ films grown by rf sputtering were highly c-axis oriented showing only (001) reflections in the X-ray diffraction pattern unlike in the case of amorphous films grown by pulsed laser deposition (PLD). The bulk powder of AgCoO₂ was synthesized by hydrothermal process. The optical bandgap was estimated as 4·15 eV and has a transmission of about 50% in the visible region. The temperature dependence of conductivity shows a semiconducting behaviour. The positive sign of Seebeck coefficient (+220 μVK⁻¹) indicates p-type conductivity. Transparent p-n heterojunction on glass substrate was fabricated by rf magnetron sputtering of p-AgCoO₂ and n-type ZnO: Al thin films. The structure of the diode was glass/ITO/n-ZnO/p-AgCoO₂. The junction between p-AgCoO₂ and n-ZnO was found to be rectifying.