Application of a vector-analytic model for metrological analysis of an infrared Fourier spectrometer

The use of a vector-analytic method of computational estimation of the error of a measuring device is demonstrated using an infrared Fourier spectrometer as an example. The results of such an estimate are compared with experiment and results obtained by two other methods. __________ Translated from Izmeritel’naya Tekhnika, No. 2, pp. 28–32, February, 2008.