COMBINATORIAL DESIGN APPROACHES FOR AUTOMATIC TEST GENERATION

The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a new parameters, every combination of valid values of arbitrary n(n≥2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained. Supported in part by National Natural Science Foundation of China (No.60373066), National Grand Fundamental Research 973 Program of China (2002CB312000), National Research Foundation for the Doctoral Program of Higher Education of China (20020286004) Communication author: Shi Liang, born in 1979, male, graduate student. Department of Computer Science & Engineering, Southeast University, Nanjing 210096, China.