| 系统建模与去嵌在RF IC批量测试中的应用 |
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| 引用本文： | 黄成,文科,叶达,程杰. 系统建模与去嵌在RF IC批量测试中的应用[J]. 微电子学, 2017, 47(2): 289-292 |
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| 作者姓名： | 黄成 文科 叶达 程杰 |
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| 作者单位： | 中国电子科技集团公司 第二十四研究所, 重庆 400060,中国电子科技集团公司 第二十四研究所, 重庆 400060,中国电子科技集团公司 第二十四研究所, 重庆 400060,中国电子科技集团公司 第二十四研究所, 重庆 400060 |
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| 摘 要： | 生产测试中通常使用网络分析仪进行射频集成电路(RF IC)S参数测量。一些表贴封装元器件不能直接与网络分析仪连接,通常使用含夹具的测试系统进行连接测试。在无法提供有效校准件的情况下,提出了利用测试系统建模结合去嵌入的方法,解决了RF IC批量测试中的S参数测试问题,并进行了对比验证。
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| 关 键 词： | S参数 去嵌入 夹具效应 射频测量 网络分析仪 |
| 收稿时间： | 2016-03-09 |
Test System Modeling and De-Embedding for Production Testing of RF IC |
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| HUANG Cheng,WEN Ke,YE Da and CHENG Jie. Test System Modeling and De-Embedding for Production Testing of RF IC[J]. Microelectronics, 2017, 47(2): 289-292 |
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| Authors: | HUANG Cheng WEN Ke YE Da CHENG Jie |
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| Affiliation: | Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China,Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China,Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China and Sichuan Institute of Solid-State Circuits, China Electronics Technology Group Corp., Chongqing 400060, P. R. China |
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| Abstract: | In the procedure of RF IC production test, the vector network analyzers(VNA) are used typically for S-parameter measurements. Some surface-mount components can not be connected directly to the ports of VNA. So the fixtures are commonly used to connect the components in the test systems. Sometimes one of the valid calibration kits can not be provided for the test system with a fixture. To eliminate the influence of the test system such as in this case, the system modeling and de-embedding were proposed to solve the S-parameter test problem of RF IC production measurements. It had been verified contrastly. |
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