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High-speed InGaP/GaAs HBTs with a strained InxGa1-xAs base
Authors:Ahmari   D.A. Fresina   M.T. Hartmann   Q.J. Barlage   D.W. Mares   P.J. Feng   M. Stillman   G.E.
Affiliation:Microelectron. Lab., Illinois Univ., Urbana, IL ;
Abstract:
A self-aligned InGaP/GaAs heterojunction bipolar transistor with a compositionally graded InxGa1-xAs base has been demonstrated with fT=83 GHz and fmax=197 GHz. To our knowledge, these results are the highest reported for both parameters in InGaP/GaAs HBT's. The graded base, which improves electron transport through the base, results in a DC current gain and a cutoff frequency which are 100% and 20% higher, respectively, than that achieved by an identical device with a nongraded base. The high fmax results from a heavily doped base, self-aligned base contacts, and a self-aligned collector etch. These results demonstrate the applicability of InGaP/GaAs HBT's in high-speed microwave applications
Keywords:
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