High-speed InGaP/GaAs HBTs with a strained InxGa1-xAs base |
| |
Authors: | Ahmari D.A. Fresina M.T. Hartmann Q.J. Barlage D.W. Mares P.J. Feng M. Stillman G.E. |
| |
Affiliation: | Microelectron. Lab., Illinois Univ., Urbana, IL ; |
| |
Abstract: | ![]() A self-aligned InGaP/GaAs heterojunction bipolar transistor with a compositionally graded InxGa1-xAs base has been demonstrated with fT=83 GHz and fmax=197 GHz. To our knowledge, these results are the highest reported for both parameters in InGaP/GaAs HBT's. The graded base, which improves electron transport through the base, results in a DC current gain and a cutoff frequency which are 100% and 20% higher, respectively, than that achieved by an identical device with a nongraded base. The high fmax results from a heavily doped base, self-aligned base contacts, and a self-aligned collector etch. These results demonstrate the applicability of InGaP/GaAs HBT's in high-speed microwave applications |
| |
Keywords: | |
|
|