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Classification of sentiment reviews using n-gram machine learning approach
Affiliation:1. Universidad de Cantabria, Av. de los Castros s/n, Santander 39005, Spain;2. Universidad de Oviedo, Calle San Francisco 1, Oviedo 33003, Spain;3. Universidad de Deusto, Av. de las Universidades 24, Bilbao 48007, Spain;1. Computer Science Department, Federal University of São Carlos, Rod. Washington Luís Km 235, São Carlos, SP 13565-905, PO Box 676, Brazil;2. FACCAMP, R. Guatemala 167, Campo Limpo Paulista, SP 13231-230, Brazil;3. Department of Computer Science and Mathematics, School of Philosophy, Science and Literature of Ribeirão Preto, University of São Paulo, Av. Bandeirantes 3900, Ribeirão Preto, SP 14040-901, Brazil;1. Department of Software Engineering, University of Granada, Granada 18071, Spain;2. Department of Marketing and Market Research, Complutense University of Madrid, 28015 Madrid, Spain;3. Department of Computer Science and Artificial Intelligence, University of Granada, 18071 Granada, Spain;4. Department of Electrical and Computer Engineering, King Abdulaziz University, 21589 Jeddah, Saudi Arabia
Abstract:With the ever increasing social networking and online marketing sites, the reviews and blogs obtained from those, act as an important source for further analysis and improved decision making. These reviews are mostly unstructured by nature and thus, need processing like classification or clustering to provide a meaningful information for future uses. These reviews and blogs may be classified into different polarity groups such as positive, negative, and neutral in order to extract information from the input dataset. Supervised machine learning methods help to classify these reviews. In this paper, four different machine learning algorithms such as Naive Bayes (NB), Maximum Entropy (ME), Stochastic Gradient Descent (SGD), and Support Vector Machine (SVM) have been considered for classification of human sentiments. The accuracy of different methods are critically examined in order to access their performance on the basis of parameters such as precision, recall, f-measure, and accuracy.
Keywords:
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