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基于独立分量分析的光电耦合器件可靠性时域筛选方法
引用本文:周求湛,张苑,孙玉晶,张贺彬,谢宁.基于独立分量分析的光电耦合器件可靠性时域筛选方法[J].吉林大学学报(工学版),2008,38(5):1242-1247.
作者姓名:周求湛  张苑  孙玉晶  张贺彬  谢宁
作者单位:吉林大学,通信工程学院,长春,130022
摘    要:针对目前光电耦合器件可靠性筛选方法的不足,提出了用独立分量分析(ICA)的方法对噪声信号进行时域分析,并利用ICA中峭度和熵两个参量讨论了各种基本噪声的特性。根据这些特性,应用ICA方法把各基本噪声从噪声信号中分离出来,并给出了时域下器件的可靠性分类规则。

关 键 词:半导体技术  光电耦合器件  可靠性  低频噪声  时域分析  独立分量分析  虚拟仪器

Time-domain screening method of the reliability of optoelectron coupled devices based on independent component analysis
ZHOU Qiu-zhan,ZHANG Yuan,SUN Yu-jing,ZHANG He-bin,XIE Ning.Time-domain screening method of the reliability of optoelectron coupled devices based on independent component analysis[J].Journal of Jilin University:Eng and Technol Ed,2008,38(5):1242-1247.
Authors:ZHOU Qiu-zhan  ZHANG Yuan  SUN Yu-jing  ZHANG He-bin  XIE Ning
Affiliation:College of Communication Engineering;Jilin University;Changchun 130022;China
Abstract:In view of the disadvantage of the traditional reliability screening method of the optoelectron coupled device(OCD),a new time-domain analysis method based on the independent component analysis(ICA) was proposed to analyze the noisy signals.The characteristics of the basic noises were analyzed with the two parameters in the ICA—kurtosis and entropy.According to these characteristics the basic noises were separated from the noisy signals by the ICA.The reliability classification rules of OCDs in the time domain were given by experiments.
Keywords:semiconductor  optoelectron coupled device(OCD)  reliability  low-frequency noise  time-domain analysis  independent component analysis(ICA)  virtual instrumentation
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