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BJ016E器件热变形的全息干涉研究
引用本文:耿照新,崔大付,胡毅. BJ016E器件热变形的全息干涉研究[J]. 激光杂志, 2006, 27(2): 48-49
作者姓名:耿照新  崔大付  胡毅
作者单位:中国科学院电子学研究所北京,100080;郧阳师范高等专科学校物理系,丹江口,442700
摘    要:采用二次曝光和实时全息干涉技术对BJ016E器件进行了实验测试,获得了不同功率条件下BJ016E表面的离面位移分布以及离面位移随时间的三组动态变化图像。结果表明,随功率的增大器件的离面翘曲量增大,热源区附近的离面翘曲量变化较快而且较大。

关 键 词:可靠性  全息干涉  热力耦合
文章编号:0253-2743(2006)02-0048-02
收稿时间:2005-08-06
修稿时间:2005-08-05

The study of Holographic Interferometry in the thermal deformation of BJ016E apparatus
GENG Zhao-xin,CUI Da-fu,HU Yi. The study of Holographic Interferometry in the thermal deformation of BJ016E apparatus[J]. Laser Journal, 2006, 27(2): 48-49
Authors:GENG Zhao-xin  CUI Da-fu  HU Yi
Affiliation:1. Institute of Electronics, Chinese Academy of Sciences, Beijing 100080, China; 2.Department of Physics , Yunyang Teachers College, Danjiangkou, 442700, China
Abstract:Double exposure holograms and real - time holographic Interferometry are applied to test a BJO16E apparatus. The out - of - plane displacement distributing and the full - motion video - images of the out - of - plane displacement under different power conditions are get by deposing the two different pattern stripe. The results show that the out - of- plane displacement of BJ016E increases with the power increasing and the out - of- plane displacement in district of resistance vary quickly and largely.
Keywords:reliability   holographic interferometry   thermal - mechanical - couple
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