关于状态差计数法输入概率的优化

建立在逻辑电路内容自测试的基础上，提出了一种新的优化伪随机序列输入概率的方法，首先找到了最难测故障在电路中的分布，建立了对应于最难测故障的电路模型，然后根据状态差计数法对这些电路模型的输出信号进行压缩，通过分析压缩后的数据，得出最难测的故障检测率，最后利用电路的原始输入概率与故障检测之间的关系，提出了一种优化输入概率的算法，求出了测试数字电路最佳的原始输入概率。

On Input Probability Optimum for State-Difference Counting

Based on the build-in self-test for logic circuits, a new approach is proposed to optimize input probability for pseudorandom sequence. After finding the worst faults in the circuit and creating their circuit models the output signals of these models will be compressed by state-difference counting. The fault detection probabilities for the worst faults can be obtained by analyzing compact data. Finally, using the relation between the input probabilities and the fault detection probabilities a new approach is proposed to optimize the input probability, and optimal input probabilities are received.