首页 | 本学科首页   官方微博 | 高级检索  
     


Reliability test of an electron cyclotron resonance ion source for accelerator driven sub-critical system
Authors:Cui B  Tang B  Ma R  Huang Q  Ma Y  Chen L  Jiang W
Affiliation:China Institute of Atomic Energy, P. O. Box 275(27), Beijing 102413, China. cui@ciae.ac.cn
Abstract:
The reliability test of an electron cyclotron resonance ion source developed for accelerator driven sub-critical system is carried out in China Institute of Atomic Energy. A unique technique to improve the reliability is adopted. The source is operated for more than 200 h at 75 keV, 100 mA extracted hydrogen current, while 2 beam trips are recorded in the period, and uninterrupted operation time is about 150 h. The experimental result is described.
Keywords:
本文献已被 PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号