| 强反射复杂表面随机缺陷自动检测系统 |
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| 引用本文： | 曲兴华,何滢,韩峰,赵旭辉,叶声华. 强反射复杂表面随机缺陷自动检测系统[J]. 光电工程, 2003, 30(2): 32-35 |
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| 作者姓名： | 曲兴华 何滢 韩峰 赵旭辉 叶声华 |
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| 作者单位： | 天津大学精密测试技术及仪器国家重点实验室,天津,300072;内蒙古工业大学机械学院,内蒙,呼和浩特,010062 |
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| 摘 要： | 系统采用分光照明方式,设计均匀散射光源,通过图像增强预处理,灰度分析,图像二值化,特征提取与图像识别, 自动分选出表面有缺陷的工件。硬软件包括:光学系统;接收系统;控制电路和Visual C 、汇编语言程序等。系统有效解决了强反射光、复杂表面和随机缺陷带来的检测困难,检测精度可达97.3%。
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| 关 键 词： | CCD检测 表面缺陷 计算机图像处理 |
| 文章编号： | 1003-501X(2003)02-0032-04 |
| 收稿时间： | 2002-04-01 |
| 修稿时间： | 2002-04-01 |
An automatic inspection system for random defects on strongly reflective and complex surface |
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| QU Xing-hua, HE Ying,HAN Feng ZHAO Xu-hui,YE Sheng-hua. An automatic inspection system for random defects on strongly reflective and complex surface[J]. Opto-Electronic Engineering, 2003, 30(2): 32-35 |
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| Authors: | QU Xing-hua HE Ying HAN Feng ZHAO Xu-hui YE Sheng-hua |
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| Affiliation: | QU Xing-hua,1 HE Ying1,HAN Feng2 ZHAO Xu-hui1,YE Sheng-hua1 |
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| Abstract: | With beam-splitting illumination scheme and uniform scattering light source, the system automatically sorts the workpiece with defects on its surface through image intensity pre-processing, gray scale analysis, image binarization, characteristics extracting and image recognition. The hardware and software consist of optical system, receiving system, control circuit and Visual C and assembler language program, etc. The system effectively solves the inspecting difficulties introduced by strongly reflective light, complex surface and random defects, and its inspection accuracy can be as high as 97.3%. |
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| Keywords: | CCD detection Surface defects Computerised image processing |
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