Morphology of porous n-GaP anodically formed in different mineral acids |
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Authors: | J. Wloka P. Schmuki |
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Affiliation: | (1) Department of Materials Science, LKO, University of Erlangen Nuremberg, Martensstr. 7, Erlangen, D-91058, Germany |
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Abstract: | n-type GaP(100) was anodized in H2SO4, HF, HCl, HBr, HI, HNO3 and H3PO4 in order to obtain porous structures. Remarkable differences in the morphology were found when anodisation was carried out under comparable electrochemical conditions. Etching in HF led to a statistically porous structure, but no evidence for higher ordering was obtained. Etching in HCl solutions caused a localized attack of the surface leading to porous insular areas. In HBr highly defined rectangular pores grow perpendicular to the (100)-surface forming several μm thick well defined porous layers. In HI pores are aligned parallel to equipotential lines along defects. Pore formation in H3PO4 and HNO3 can lead to highly complex ordered structures. Clearly the work shows that the formation of porous n-GaP is strongly dependent on the anion present in the electrolyte. |
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Keywords: | Gallium phospide Electrochemical etching Porous semiconductors Pore morphology |
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