首页 | 本学科首页   官方微博 | 高级检索  
     

一种FPGA验证与测试方法介绍
引用本文:张凯虹,陈诚,万书芹.一种FPGA验证与测试方法介绍[J].电子与封装,2012(7):15-17.
作者姓名:张凯虹  陈诚  万书芹
作者单位:中国电子科技集团公司第58研究所,江苏无锡214035
摘    要:文章重点介绍了一种FPGA验证与测试的方法。该测试方法的优点是不依赖于芯片设计与测试机台,低成本、开发周期短。基于PC、ATE与自制转换软件,对FPGA验证与测试开发技术进行研究。PC主要完成bin文件的生成,自制转换软件主要将bin文件转换为机器可识别的atp文件。ATE导入配置文件、完成信号输入与输出验证。基于该理论对Xilinx公司的XCV1000进行了实验,实验表明该方法可行并能快速实现测试开发与芯片验证,且具有很好的通用性,可用于其他FPGA芯片的测试、研究与验证,还可以应用于不同的ATE机台。

关 键 词:自动测试系统(ATE)  现场可编程门阵列(FPGA)  测试

One for FPGA Verification and Testing Methods
ZHANG Kai-hong,CHEN Cheng,WAN Shu-qin.One for FPGA Verification and Testing Methods[J].Electronics & Packaging,2012(7):15-17.
Authors:ZHANG Kai-hong  CHEN Cheng  WAN Shu-qin
Affiliation:(China Electronics Technology Group Corporation No.58 Research Institute, Wuxi 214035, China)
Abstract:This paper focuses on validate and test method of FPGA. The advantage of this method is independent of IC design and ATE, low test cost, short develop time. Based on PC, ATE and Self-applied conversion software, experiments are conducted to research on validate and test on the FPGA. PC main completes bit file, self-applied conversion software to achieve file conversion from bit to atp, ATE imports configuration files, then implements the signal input and output validation. Based on the theory, Experiments carried out on the QVR1000 of Xilinx Inc. Experiments show that the method is feasible and can rapidly achieve test development, and has a good versatility, Can be used to Other FPGA chip testing, research and verification, Can be application this method to kinds of ATE.
Keywords:automated test equipment (ATE)  field programmable gate array (FPGA)  testing
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号