High frequency properties of shielded power cable. Part 2: sources of error in measuring shield dielectric properties |
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| Authors: | Chunchuan Xu Boggs S.A. |
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| Affiliation: | Electr. Insulation Res. Center, Connecticut Univ., USA; |
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| Abstract: | ![]()
This paper provides a theoretical context for the types of errors that are likely to occur during the measurement of high frequency cable shield properties. The paper considers a RC dielectric system as it relates to measuring the dielectric properties of cable shield materials. |
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