| JTAG测试中扫描链的配置问题研究 |
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| 引用本文： | 张磊,于晓辉,刘冲. JTAG测试中扫描链的配置问题研究[J]. 电光与控制, 2010, 17(6) |
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| 作者姓名： | 张磊 于晓辉 刘冲 |
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| 作者单位： | 海军驻洛阳地区航空军代表室,河南,洛阳,471009;中航工业洛阳电光设备研究所,河南,洛阳,471009 |
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| 摘 要： | 分析了常见扫描链路配置中面临的问题,提出了一种扫描链配置方案。结合工程测试中出现的实际问题,给出了有关扫描链路配置的一些建议和注意事项。
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| 关 键 词： | 集成电路 边界扫描 扫描链 测试 |
Configuration of Boundary Scan Chain Based on JTAG Test |
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| ZHANG Lei,YU Xiaohui,LIU Chong. Configuration of Boundary Scan Chain Based on JTAG Test[J]. Electronics Optics & Control, 2010, 17(6) |
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| Authors: | ZHANG Lei YU Xiaohui LIU Chong |
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| Affiliation: | ZHANG Lei1,YU Xiaohui1,LIU Chong2(1.Military Aviation Deputy Office of Navy in Luoyang District,Luoyang 471009,China,2.Luoyang Institute of Electro-Optical Equipment,AVIC,China) |
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| Abstract: | The common problems in configuration of boundary scan chain are analyzed.Then a new configuration scheme of board level dynamic boundary scan chain is proposed.Some feasible suggestions and corrective measures are given based on summary to the practical problems in engineering test. |
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| Keywords: | integrated circuit boundary scan scan chain test |
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