首页 | 本学科首页   官方微博 | 高级检索  
     

箱装电子仪器安全跌落冲击数值模拟方法研究
引用本文:荆玉焕,张俊坤,高欣宝.箱装电子仪器安全跌落冲击数值模拟方法研究[J].包装工程,2012,33(7):9-12,85.
作者姓名:荆玉焕  张俊坤  高欣宝
作者单位:北京理工大学;军械工程学院
摘    要:为正确评估跌落冲击对箱装电子仪器可靠性的影响,确定了合理的包装参数和设计流程,科学指导运输与试验,分别采用理论分析和有限元计算方法对箱装电子仪器垂直跌落的情况进行了仿真,得到了垂直跌落条件下电子仪器最大加速度和最大位移随跌落高度与缓冲垫弹性模量变化的规律。结合产品脆值,确定了产品储运过程中的最大堆垛高度,并得到了合理的包装设计流程,从而为有效指导产品包装设计、实体试验和储运安全提供了理论依据。

关 键 词:跌落冲击  有限元分析  脆值
收稿时间:2/8/2012 12:00:00 AM
修稿时间:2012/4/10 0:00:00

Study of Numerical Simulation Method of Electronic Instruments Packaging Drop Impact
JING Yu-huan,ZHANG Jun-kun and GAO Xin-bao.Study of Numerical Simulation Method of Electronic Instruments Packaging Drop Impact[J].Packaging Engineering,2012,33(7):9-12,85.
Authors:JING Yu-huan  ZHANG Jun-kun and GAO Xin-bao
Affiliation:1.Beijing Institute of Technology,Beijing 100081,China;2.Ordnance Engineering College,Shijiazhuang 050003,China)
Abstract:Vertical drop in packaging electronic instruments was simulated using theory and finite element analysis to correctly assess the influence drop impact on reliability of electronic instruments,determine logical packing parameters and design process,guide transportation and experiment scientifically.The changing law of maximal acceleration and maximal displacement of electronic instruments with drop height and elastic modulus of buffer under vertical drop condition was obtained.The maximal height of products in storage and transportation was determined.Logical packaging design process was obtained.The purpose was to provide reference for packaging design,full-scale experiment and safety of storage and transportation.
Keywords:drop impact  finite element analysis  fragility
本文献已被 CNKI 等数据库收录!
点击此处可从《包装工程》浏览原始摘要信息
点击此处可从《包装工程》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号