半导体温控系统的自抗扰控制器设计

针对半导体温控系统大时间常数、时滞较大且易受参数扰动影响的问题,提出了自抗扰控制(ADRC)技术。针对自抗扰控制器待调节参数多、参数整定较为困难的问题,从fal函数特性及扩展状态观测器(ESO)设计出发,确定了自抗扰控制器的参数,并探讨了如何准确估计建模误差与外扰。仿真试验表明,系统在半导体致冷器件优值系数、冷热端温差发生变化及受到电压纹波干扰时均具有良好的鲁棒性能和动态性能。

Design of Active Disturbance Rejection Controller for Semiconductor Temperature Control System

Active disturbance rejection control(ADRC) technique is adopted to solve the problems in semiconductor temperature control systems,e.g.,large time constant,large time delay and sensitive to parameter disturbances.In accordance with the features of active disturbance rejection controller,including multiple parameters must to be adjusted,and difficult for tuning parameters,based on characteristics of fal function and the design of extended state observer(ESO),the parameters of ADRC are determined,and the methods to accurately estimate modeling error and external disturbance are discussed.Simulation tests show that the system offers strong robustness and good dynamic performance when merit coefficient and temperature difference between hot and cold ends of semiconductor refrigeration devices change,or interfered by voltage ripples.