Analysis of the biaxial strain state of Al-doped c-BN films using diffraction experiments with synchrotron radiation期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Analysis of the biaxial strain state of Al-doped c-BN films using diffraction experiments with synchrotron radiation

Authors:	Volker Linss Thorsten HalmWalter Hoyer Frank RichterNorbert Schell

Affiliation:	^a TU Chemnitz, Institut für Physik, 09107 Chemnitz, Germany ^b Forschungzentrum Rossendorf, Postfach 510119, 01314 Dresden, Germany

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