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PIXE analysis of ancient Chinese Changsha porcelain |
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| Authors: | E. K. Lin Y. C. Yu C. W. Wang T. Y. Liu C. M. Wu K. M. Chen S. S. Lin |
| Affiliation: | a Institute of Physics, Academia Sinica, Taipei, Taiwan b National Museum of History, Taipei, Taiwan |
| Abstract: | In this work, proton induced X-ray emission (PIXE) method was applied for the analysis of ancient Chinese Changsha porcelain produced in the Tang dynasty (AD 618–907). A collection of glazed potsherds was obtained in the complex of the famous kiln site at Tongguan, Changsha city, Hunan province. Studies of elemental composition were carried out on ten selected Changsha potsherds. Minor and trace elements such as Ti, Mn, Fe, Co, Cu, Rb, Sr, and Zr in the material of the porcelain glaze were determined. Variation of these elements from sample to sample was investigated. Details of results are presented and discussed. |
| Keywords: | PIXE Elemental analysis Glazed potsherd samples |
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