| 基于粒子群算法的时序电路测试生成 |
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| 引用本文： | 许川佩,李智,莫玮.基于粒子群算法的时序电路测试生成[J].电子测量与仪器学报,2006,20(1):6-9. |
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| 作者姓名： | 许川佩 李智 莫玮 |
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| 作者单位： | 1. 西安电子科技大学机电工程学院,西安,710071;桂林电子工业学院电子工程系,桂林,541004
2. 桂林电子工业学院电子工程系,桂林,541004 |
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| 基金项目： | 国家自然科学基金(编号:60266001)资助项目
广西自然科学基金项目(桂科自0542051) |
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| 摘 要： | 本文论述了将粒子群算法应用在时序电路自动测试生成的研究结果。结合时序电路的特点,构造测试生成的粒子表达方式,建立自动测试生成离散粒子群速度-位置模型,通过群体中粒子间的合作与竞争产生的群体智能指导优化搜索。针对国际标准时序电路的验证结果表明,与同类算法相比,该算法可以获得较高的故障覆盖率和较小的测试矢量集。
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| 关 键 词： | 粒子群算法 自动测试生成 时序电路 |
| 收稿时间： | 2005-08 |
| 修稿时间： | 2005年8月1日 |
Automatic Test Pattern Generation Based on Particle Swarm Optimization Algorithm for Sequential Circuits |
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| Xu Chuanpei,Li Zhi,Mo Wei.Automatic Test Pattern Generation Based on Particle Swarm Optimization Algorithm for Sequential Circuits[J].Journal of Electronic Measurement and Instrument,2006,20(1):6-9. |
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| Authors: | Xu Chuanpei Li Zhi Mo Wei |
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| Affiliation: | 1. School of Mechano-Electronic Engineering, Xidian University, Xian 710071, China; 2. Dept. of Electronic Engineering, GuiLin University of Electronic Technology, Guilin 541004, China |
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| Abstract: | This paper discussed the results achieved by applying particle swarm optimization algorithm to automatic test pattern generation of sequential circuits. By combining the characteristics of sequential circuits and constructing par-ticle expression of test generation, the paper made the speed-position model of discrete partide swarm optimization for automatic test generation. The optimized search is guided by the swarm intelligent generated from cooperation and competi-tion among particles of swarm. The experimental results for benchmark circuits show that the proposed algorithm can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms. |
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| Keywords: | particle swarm optimization algorithm automatic test pattern generation sequential circuit |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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