| 一种便携式VDMOS单粒子试验测试系统 |
| |
| 引用本文： | 魏亚峰,滕 丽,温显超,俞 宙.一种便携式VDMOS单粒子试验测试系统[J].太赫兹科学与电子信息学报,2016,14(5):816-819. |
| |
| 作者姓名： | 魏亚峰 滕 丽 温显超 俞 宙 |
| |
| 作者单位： | Sichuan Insitute of Solid-State Circuits，China Electronics Technology Group Corp.，Chongqing 400060，China,Sichuan Insitute of Solid-State Circuits，China Electronics Technology Group Corp.，Chongqing 400060，China,Sichuan Insitute of Solid-State Circuits，China Electronics Technology Group Corp.，Chongqing 400060，China and Science Technology on Analog Integrated Circuit Laboratory，Chongqing 400060，China |
| |
| 摘 要： | 设计了一种在线测试系统，用于监测垂直双扩散金属-氧化物半导体场效应晶体管(VDMOS)器件在单粒子试验中的单粒子效应。简述了实验原理，从偏置设计与波形获取及仪器控制与远程监测多个方面详细论述了测试系统的硬件结构；给出了软件的设计流程及测试系统的操作界面。最后应用该自动测试系统开展了试验，结果表面该系统稳定可靠，便携易用。
|
| 关 键 词： | 垂直双扩散金属-氧化物半导体场效应晶体管 单粒子效应 单粒子烧毁 测试系统 |
| 收稿时间： | 7/9/2015 12:00:00 AM |
| 修稿时间： | 2015/9/12 0:00:00 |
A portable test system of VDMOS SEE |
| |
| WEI Yafeng,TENG Li,WEN Xianchao and YU Zhou.A portable test system of VDMOS SEE[J].Journal of Terahertz Science and Electronic Information Technology,2016,14(5):816-819. |
| |
| Authors: | WEI Yafeng TENG Li WEN Xianchao and YU Zhou |
| |
| Abstract: | One online test system is designed to monitor Single Event Effect(SEE) of Vertical Double-diffusion Metal Oxide Semiconductor(VDMOS) Field Effect Transistor(FET) device. The hardware structure of the test system is described in detail from the aspects of the design of the offset, the acquisition of the waveform, the control and the remote monitoring after briefly introducing the experimental principle. Then the design flow of the software and the operating interface of the test system are given. In the end, experiment is completed by using the automatic test system, and the results are obtained. It is proved that the system is stable, reliable, portable and easy to use. |
| |
| Keywords: | |
|
| 点击此处可从《太赫兹科学与电子信息学报》浏览原始摘要信息 |
|
点击此处可从《太赫兹科学与电子信息学报》下载全文 |
