Simulating the Intensifying Effect of Phosphors on Imaging Plate with UV photons

It is assumed from the energy level that ultraviolet (UV) photons may have intensifying effect on BaFBr: Eu^2 .In this paper, effect of UV photons (220-290 nm) on the PSL intensity of X-ray irradiated BaFBr:Eu^2 was measured and compared to that on the PSL intensity of 220 nm photons irradiated BaFBr: Eu^2 . It was found that after the excitation of UV photons the PSL intensity of X-ray irradiated samples decreases least at 250 nm and that of 220 nm photons irradiated samples increases most at 250 nm. When the irradiation sources are X-rays and 220 nm photons the excited electrons are photoelectron and thermal-electrons, respectively, and they have different possibility of being captured by electron traps or combined with luminescent centers. And the peak at 250 nm can be explained with the model of electrons tunneling. It is assumed that the electrons excited by 250 nm have the most possibility of tunneling.

Simulating the Intensifying Effect of Phosphors on Imaging Plate with UV photons

It is assumed from the energy level that ultraviolet(UV) photons may have intensifying effect on BaFBr∶Eu2+. In this paper, effect of UV photons(220～290 nm) on the PSL intensity of X-ray irradiated BaFBr∶Eu2+ was measured and compared to that on the PSL intensity of 220 nm photons irradiated BaFBr∶Eu2+. It was found that after the excitation of UV photons the PSL intensity of X-ray irradiated samples decreases least at 250 nm and that of 220 nm photons irradiated samples increases most at 250 nm. When the irradiation sources are X-rays and 220 nm photons the excited electrons are photoelectron and thermal-electrons, respectively, and they have different possibility of being captured by electron traps or combined with luminescent centers. And the peak at 250 nm can be explained with the model of electrons tunneling. It is assumed that the electrons excited by 250 nm have the most possibility of tunneling.