Inclusion boundary reconstruction and sensitivity analysis in electrical impedance tomography |
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| Authors: | Shangjie Ren Manuchehr Soleimani Yaoyuan Xu |
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| Affiliation: | 1. Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China.;2. Engineering Tomography Laboratory (ETL), Department of Electronic and Electrical Engineering, University of Bath, Bath, UK.;3. State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China. |
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| Abstract: | Reconstruction of conductive inclusions in a homogeneous background medium is commonly seen in electrical impedance tomography (EIT). One of the methods to deal with the inclusion reconstruction problems is the shape-based method. With prior knowledge of conductivity of target inclusions, the boundary of inclusions is parameterized by several shape coefficients and recovered from EIT measurements. This paper presents a shape-based inclusion reconstruction method and its numerical implementation with boundary element method (BEM). A shape perturbation method (SPM) is proposed to calculate the shape sensitivity in EIT. To evaluate the accuracy of the presented method, a series of numerical tests are conducted. The characteristics of EIT shape sensitivity are analysed. Some factors influencing the reconstruction performance are discussed. |
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| Keywords: | Inverse problem electrical impedance tomography inclusion reconstruction shape sensitivity boundary element method |
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