Research on COB De-embedding in Scattering Parameter Measurement

The popular radio frequency (RF) chip on board (COB) test has gradually taken the place of on-wafer test due to the high efficiency and high power. This paper presents the extended Open-Short-Load (OSL) that is one-port calibration method to verify the error model de-embedding in S parameter measurement. Three-level cascade structure on COB''s system error model is proposed and analyzed. Four kinds of calibration plane solutions for de-embedding are verified. At last, on-board calibration (CAL) kits solution is established to decrease the system error to the least value. The maximum error shift can be controlled less than 0.1 dB comparing with the on-wafer test results. In general, the practical application results prove that this method is reasonable and effective and easy to be mastered.