Implementation of a piezoresistive MEMS cantilever for nanoscale force measurement in micro/nano robotic applications |
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Authors: | Deok-Ho?Kim,Byungkyu?Kim mailto:bkim@kist.re.kr" title=" bkim@kist.re.kr" itemprop=" email" data-track=" click" data-track-action=" Email author" data-track-label=" " >Email author,Jong-Oh?Park |
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Affiliation: | (1) Microsystem Research Center, Korea Institute of Science and Technology, Cheongryang, P.O.BOX 131, 130-650 Seoul, Korea |
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Abstract: | ![]() The nanoscale sensing and manipulation have become a challenging issue in micro/nanorobotic applications. In particular, a feedback sensor-based manipulation is necessary for realizing an efficient and reliable handling of particles under uncertain environment in a micro/ nano scale. This paper presents a piezoresistive MEMS cantilever for nanoscale force measurement in microrobotics. A piezoresistive MEMS cantilever enables sensing of gripping and contact forces in nanonewton resolution by measuring changes in the stress-induced electrical resistances. The calibration of a piezoresistive MEMS cantilever is experimentally carried out. In addition, as part of the work on nanomanipulation with a piezoresistive MEMS cantilever, the analysis on the interaction forces between a tip and a material, and the associated manipulation strategies are investigated. Experiments and simulations show that a piezoresistive MEMS cantilever integrated into a microrobotic system can be effectively used in nanoscale force measurements and a sensor-based manipulation. |
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Keywords: | Piezoresistive MEMS Cantilever Atomic Force Microscope (AFM) Microrobotics Micro Force Sensing. Van der Waals Force Micro/Nano-manipulation |
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