Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy |
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| Authors: | Zaoli Zhang Wilfried SigleChristoph T Koch Manfred Rühle |
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| Affiliation: | a MPI für Metallforschung, Heisenbergstraße 3, D-70569 Stuttgart, Germany
b Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Jahnstraße 12, Austria |
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| Abstract: | We report about the dynamic behavior of a nanometer-scale amorphous intergranular film (IGF) in a Si3N4 ceramic by an in situ heating experiment in a high-resolution transmission electron microscopy (HRTEM). During the experiment the IGF gradually vanishes at 820 °C accompanied by the formation of crystal planes within the IGF. The IGF reappears after cooling back to room temperature. The results cannot be explained within the framework of a force balance model. We argue that the dynamic behavior of the IGF in our experiment originates from the open system observed. |
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| Keywords: | Si3N4 ceramic Intergranular amorphous film (IGF) In situ HRTEM Continuum model |
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