(1) Department of Chemistry, The University, Southampton, Hants, UK;(2) ICI Plastics, Welwyn Garden City, Herts, UK;(3) Present address: H. H. Wills Physics Laboratory, University of Bristol, Bristol, UK
Abstract:
Measurement of the low frequency Raman spectrum of polyethylene affords a method of following the effects of sample deformation on lamellar structure and of the process of annealing on lamellar thickness.