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Analysis and modelling of lateral heterostructure field-effect bipolar transistors
Authors:Zi-En Ooi  Samarendra P. Singh  Serene L.G. Ng  Gregory K.L. Goh  Ananth Dodabalapur
Affiliation:aInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (ASTAR), 3 Research Link, Singapore 117602, Singapore;bDepartment of Electrical and Computer Engineering, University of Texas at Austin, Austin, TX 78758, USA
Abstract:Lateral heterostructure field-effect bipolar transistors (LH-FEBTs) are thin-film transistors that have a distinct heterojunction located roughly midway between the source and drain contacts, with a p-type semiconductor on one side of the junction, and an n-type semiconductor on the other. These devices have potential in display applications but are relatively new to the research community. In this paper, we describe the fabrication of a hybrid LH-FEBT using pentacene and ZnO as the p- and n-type semiconductors, respectively, and describe its unusual bell-shaped electrical transfer characteristics. Using an equivalent circuit approach, we analyse quantitatively how the main features of the current–voltage curves relate to semiconductor properties such as carrier mobility and threshold voltage – information that is essential to the design of such devices.
Keywords:OFET   Light-emitting transistor   Zinc oxide   LH-FEBT
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