The Spectral Emissivity of an Oxide Film of Zirconium for Wavelengths of 530 and 650 nm in the Temperature Range from 1450 to 1750 K |
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Authors: | V. Ya. Chekhovskoi V. D. Tarasov N. V. Grigor'eva |
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Affiliation: | (1) Russian Academy of Sciences, Institute of High Energy Densities, IVTAN (Institute of High Temperatures) Scientific Association, Moscow, 125412, Russia |
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Abstract: | The pyrometer method is used to investigate the spectral emissivity of an oxide film of zirconium of a nonstoichiometric composition in the temperature range from 1450 to 1750 K for wavelengths of 530 and 650 nm. The obtained data are used to calculate the color temperature. The results relate to a tetragonal structure of zirconium oxide in the range from 1450 to 1730 K and to a mixture of tetragonal and cubic structures at 1745 K. The sample to be investigated is heated in a high-frequency field of a multiturn cylindrical inductor in an air/argon mixture in a hermetically sealed volume with a volume content of air of 6.2%. The oxide film thickness, estimated by the increment of the sample mass, ranges from 124 to 613 mcm. The estimated error of measurement of the coefficients of spectral emissivity is 10%. |
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Keywords: | color temperature oxide film thickness tetragonal and cubic structures |
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