| 面向电源噪声的动态电流测试 |
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| 引用本文： | 陆思安,严晓浪,沈海斌,何乐年.面向电源噪声的动态电流测试[J].电路与系统学报,2003,8(2):121-123,129. |
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| 作者姓名： | 陆思安 严晓浪 沈海斌 何乐年 |
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| 作者单位： | 浙江大学,超大规模集成电路设计研究所,浙江,杭州,310027 |
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| 摘 要： | 电源噪声在深亚微米设计中正变得越来越突出，而因电源噪声引起的电路故障测试也变得越来越重要。本文针对这一情况提出了动态电流测试来实现由电源噪声引起的故障测试。与IddQ测试不同，动态电流测试依据电路中的器件切换时电源电流的动态变化情况来判断电路中是否存在故障。通过仿真分析，动态电流测试是可行的。
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| 关 键 词： | 电源噪声 动态电流测试 电流积分 测量电阻 |
| 文章编号： | 1007-0249(2003)02-0121-04 |
Dynamic Current Testing on Power Supply Noise |
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| LU Si-an,YAN XIAO-lang,SHEN Hai-bin,HE Le-nian.Dynamic Current Testing on Power Supply Noise[J].Journal of Circuits and Systems,2003,8(2):121-123,129. |
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| Authors: | LU Si-an YAN XIAO-lang SHEN Hai-bin HE Le-nian |
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| Abstract: | Power supply noise is more and more prominent during DSM (Deep Sub-Micrometer) circuit design, and testing of the faults caused by power supply noise is getting more important. For this reason, a dynamic current testing approach is proposed to test the faults caused by power supply noise. Different from IddQ testing, dynamic current testing judges the existence of fault in the circuit by power current changing during circuit switching. According to the analysis on simulation results, dynamic current testing is effective. |
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| Keywords: | Power Supply Noise Dynamic Current Testing Current Integration Measuring Resistance |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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