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Comparative Study of TiAu-Based TES Microcalorimeters with Different Geometries |
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| Authors: | H. F. C. Hoevers M. P. Bruijn B. P. F. Dirks L. Gottardi P. A. J. de Korte J. van der Kuur A. M. Popescu M. L. Ridder Y. Takei D. H. J. Takken |
| Affiliation: | (1) SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, the Netherlands |
| Abstract: | Seven microcalorimeters with different geometries have been tested and their performance is compared. The study, for TiAu TESs with a Cu absorber, indicates the presence of so-called constant voltage noise and internal thermal fluctuation noise. The constant voltage noise is not changed by a normal metal pattern on the TES, or by a magnetic field. The energy resolution of the detectors, having different heat capacities, is 2.5 and 5.0 eV (at 5.9 keV). |
| Keywords: | Transition edge sensor X-ray microcalorimeter Excess noise |
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