电子装备通用测试体系关键技术研究

为解决电子装备自动测试系统的数量多,功能重复等问题,提出了电子装备通用测试平台,通过分析多种总线结构、测试硬件和驱动体系的核心指标与技术特征,借鉴分层思想设计通用型体系架构,以多种测试仪器为基础,利用多层次的驱动体系屏蔽混合总线差异,将测试程序与测试仪器分离,实现了只需更换测试仪器和配置对应的驱动,便可置换底层仪器,使通用测试平台具备较强的扩展能力,覆盖更多测试需求,有效降低测试系统的数量。

Research on general test system for electronic equipment

To solve the problem of high repetition rate in the automatic test system of electronic equipment,a general test platform of electronic equipment is proposed.By analyzing the core indexes of hybrid buses,instruments and driver system,a general framework is designed with reference to the layering idea.Based on a variety of test instruments,a multi-level drive system is used to shield the differences of hybrid buses and separating the test program from the test instrument,the underlying instrument can be replaced very simply,so that the general test platform has strong expansion ability,meet more test requirements,and effectively reduces the number of test systems.