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Space-charge-limited current measurement of traps in p-type electrochemically deposited CdTe thin films
Authors:S.S. Ou  O.M. Stafsudd  B.M. Basol
Affiliation:Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA 90024 U.S.A.;Monosolar Inc., 8635 Aviation Boulevard, Inglewood, CA 90301 U.S.A.
Abstract:
Space-charge-limited current measurements were performed on high resistivity p-type electrodeposited CdTe thin films. The observed dominant trap is a hole trap located at 0.54 eV above the valence band with a density of 1 × 1014 cm?3
Keywords:
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