Space-charge-limited current measurement of traps in p-type electrochemically deposited CdTe thin films |
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Authors: | S.S. Ou O.M. Stafsudd B.M. Basol |
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Affiliation: | Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA 90024 U.S.A.;Monosolar Inc., 8635 Aviation Boulevard, Inglewood, CA 90301 U.S.A. |
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Abstract: | ![]() Space-charge-limited current measurements were performed on high resistivity p-type electrodeposited CdTe thin films. The observed dominant trap is a hole trap located at 0.54 eV above the valence band with a density of 1 × 1014 cm?3 |
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