A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O

An instrument for on-chip measurement of transceiver transmission capability is described that is fully realizable in CMOS technology and embeddable within an SoC. The instrument can be used to inject and extract the timing and voltage information associated with signals in high-speed transceiver circuits that are commonly found in data communication applications. At the core of this work is the use of ΣΔ amplitude- and phase-encoding techniques to generate both the voltage and timing (phase) references, or strobes used for high-speed sampling. The same technique is also used for generating the test stimulant for the device-under-test.