首页 | 本学科首页   官方微博 | 高级检索  
     


A Dislocation barrier model for fatigue crack growth threshold
Authors:H.W. Liu
Abstract:The primary mechanism of fatigue crack growth is crack-tip dislocation emission followed by the glide of the emitted dislocations. Both of these two processes are controlled by the crack-tip resolved shear stress field, which is characterized by the resolved shear stress intensity factor, 
$$K_{Rtau } $$
. A dislocation barrier model for fatigue crack growth threshold is constructed. The model assumes that a fatigue crack stops growing when crack-tip slip bands are incapable of penetrating the primary dislocation barrier. The derived and deduced threshold behaviors agree with the observed constant threshold Kmax,th in the low R region and constant threshold ΔKth in the high R region. Kmax,th is the Kmax at the threshold. The constant Kmax,th is related to the resistance of the primary dislocation barrier, which in most of cases is grain boundary; and the constant ΔKth is related to the resistance of secondary barriers. Furthermore, the analysis shows that Kmax,th is proportional to √d, where d is the grain size. The relation has been observed in steels. The model also helps to explain the characteristics of, and the transition from, microstructure-sensitive to microstructure-insensitive growth. This revised version was published online in July 2006 with corrections to the Cover Date.
Keywords:Fatigue crack growth  fatigue threshold  dislocation model  dislocation barriers  R-ratio  grain size  microstructure sensitive  microstructure insensitive  facet
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号