原子力声显微镜的原理及应用

原子力声显微镜结合了超声检测技术的三维成像能力与原子力显微镜的纳米尺度成像的近场显微技术。它在商用的原子力显微镜设备的基础上加以压电超声传感器产生声激励,并使用锁相放大器对数据进行收集分析,既可得到三维的纳米级的清晰形貌图,又能通过建模分析样品表面的接触刚度及样品的弹性模量。目前,原子力显微镜被广泛应用于材料领域,用于检测样品的机械性能,比如样品的接触刚度、薄膜高分子材料的弹性模量,同时还运用于医学生物领域,用于观察细胞的超微结构及其表面和亚表面的弹性模量等。

Applicantion and principle of the atomic force acoustic microscopy

Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. The ultrasonic signals are excited by a ultrasonic piezoelectric generator which is added to a commercial AFM.3-D and the high resolution images in nano scale are achieved by the analysis of the lock-in amplifier and the computer. Atomic force acoustic microscopy has been presented to measure the mechanical characterization of the sample, such as contact stiffness,the elastic modulus of the films and also the submicrometre structures of the cell.