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Integrated carbon nanotube field emission differential amplifier: Modeling and measurement of the common-mode rejection ratio
Authors:YM Wong  WP Kang  JL Davidson  JH Huang  DV Kerns
Affiliation:1. Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235, USA;2. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, ROC;3. Olin College of Engineering, Needham, MA 02492, USA
Abstract:A novel integrated vacuum field emission (VFE) differential amplifier (diff-amp) utilizing carbon nanotube (CNT) emitters has been developed. A dual-mask microfabrication process was employed to achieve a VFE diff-amp by integrating identical CNT VFE transistors with built-in split gates and integrated anodes. The identical pair of triode amplifiers was well-matched in their device characteristics. The measured ac small-signal characteristics of the diff-amp showed a common-mode-rejection ratio (CMRR) of ~ 320 (~ 50 dB). The proposed analytical model of the CMRR was verified to be in good agreement with the experimental data. The successful implementation of the CNT diff-amp demonstrates a new way to achieve temperature and radiation tolerant VFE integrated microelectronics.
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