Effects of off-focal radiation on dimensional measurements in industrial cone-beam micro-focus X-ray computed tomography systems |
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| Affiliation: | 1. Mechanical Engineering Department, KU Leuven, Belgium;2. Institute of Data Processing and Electronics, Karlsruhe Institute of Technology, Germany;1. Engineering Measurement Division, National Physical Laboratory, Hampton Road, Teddington TW11 0LW, Middlesex, United Kingdom;2. Department of Mechanical Engineering, KU Leuven, Celestijnenlaan 300—Box 2420, 3001 Leuven, Belgium;3. Department of Management and Engineering, Università degli Studi di Padova, Stradella San Nicola 3, 36100 Vicenza, Italy;1. Georgia Institute of Technology, Atlanta, GA, 30318, USA |
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| Abstract: | A study of the secondary source phenomenon due to the presence of off-focal radiation in industrial micro-focus cone-beam X-ray computed tomography (XCT) systems and its influence on dimensional measurements is presented. Although off-focal radiation production within X-ray tubes has been studied for medical X-ray imaging systems, its properties and its effects on dimensional measurements in industrial XCT systems have not been discussed prior to this research. The study comprises: evaluation of the geometrical properties of off-focal radiation through a theoretical and experimental study of two-dimensional projection images of the scanned objects, verification of these properties using computer simulations and evaluation of the impact of the secondary source on dimensional measurements using experimental and simulation approaches. In addition, ways to minimise the effects of off-focal radiation are discussed, and reference samples for characterising the properties of off-focal radiation are proposed. |
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| Keywords: | X-ray computed tomography Off-focal radiation Dimensional metrology |
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