首页 | 本学科首页   官方微博 | 高级检索  
     

军用集成电路失效分析
引用本文:孙家坤.军用集成电路失效分析[J].电子测试,2017(6).
作者姓名:孙家坤
作者单位:中船重工第716研究所,江苏 连云港,222000
摘    要:随着科学技术的发展,集成电路在我国军用武器装备上的应用越来越广泛,其可靠性成为制约我国武器装备质量的一项重要因素,失效分析是集成电路可靠性及质量保证的重要环节,本文从失效分析的流程、方法、技术及发展入手,对军用集成电路的失效模式及失效机理进行了详细的讲解,随着元器件设计与制造技术的不断提高及失效分析技术和工具的逐步完善,失效分析工作将在集成电路质量控制方面发挥更大的作用.

关 键 词:集成电路  失效分析  电性分析  物理分析

Failure Analysis on Military Integrated circuit
Sun JiaKun.Failure Analysis on Military Integrated circuit[J].Electronic Test,2017(6).
Authors:Sun JiaKun
Abstract:with the development of science and technology,the application of the integrated circuit (IC) in Chinese armament quality,failure analysis is taken as one of the important chain for IC reliability and quality assurance,in view of the flow,method,and development for failure analysis,this thesis explains failure mode and failure mechanism on military IC in detail,with continuous improvement of component design and manufacture technology and gradual perfection of failure analysis technology and tool,failure analysis will play more important role in the light of IC quality control.
Keywords:Integrated circuit  Failure analysis  Electrical analysis  Physical anaylysis
本文献已被 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号