首页 | 本学科首页   官方微博 | 高级检索  
     

就地化保护装置跌落冲击载荷下的可靠性分析
引用本文:王新春,周华良,郑立亮,夏雨,甘云华,周辉.就地化保护装置跌落冲击载荷下的可靠性分析[J].包装工程,2019,40(13):160-165.
作者姓名:王新春  周华良  郑立亮  夏雨  甘云华  周辉
作者单位:南瑞集团(国网电力科学研究院)有限公司,南京211106;国电南瑞科技股份有限公司,南京211106;南瑞集团(国网电力科学研究院)有限公司,南京211106;国电南瑞科技股份有限公司,南京211106;智能电网保护和运行控制国家重点实验室,南京211106
摘    要:目的 为了评估就地化保护装置跌落冲击载荷下的失效情况。方法 基于显式动力学理论,采用有限元法对就地化保护装置进行跌落冲击的建模仿真。分析PCB板变形与焊点失效之间的关系,探讨元件封装方式对产品抗跌落冲击性能的影响,提出以Von Mises准则得到的焊点最大应力联合跌落寿命模型,进行元件封装可靠性评估的分析方法。针对元件不同封装方式的装置进行跌落验证试验。结果 就地化保护装置跌落冲击仿真结果与试验结果基本吻合。结论 验证了评估元件封装失效分析方法的准确性,为推断产品可靠性提供了理论支撑。

关 键 词:就地化保护装置  跌落冲击  可靠性  有限元
收稿时间:2019/1/21 0:00:00
修稿时间:2019/7/10 0:00:00

Reliability Analysis of In-situ Protection Devices under Drop Impact Loading
WANG Xin-chun,ZHOU Hua-liang,ZHENG Li-liang,XIA Yu,GAN Yun-hua and ZHOU Hui.Reliability Analysis of In-situ Protection Devices under Drop Impact Loading[J].Packaging Engineering,2019,40(13):160-165.
Authors:WANG Xin-chun  ZHOU Hua-liang  ZHENG Li-liang  XIA Yu  GAN Yun-hua and ZHOU Hui
Affiliation:1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China,1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China; 3.State Key Laboratory of Smart Grid Protection and Control, Nanjing 211106, China,1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China,1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China,1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China and 1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China; 2.NARI Technology Co., Ltd., Nanjing 211106, China
Abstract:The paper aims to explore the reliability of in-situ protective devices under drop impact load. Based on explicit dynamics theory, the finite element method (FEM) was used to simulate the drop impact of in-situ protective devices. The relationship between PCB plate deformation and solder joint failure was analyzed, and the influence of component encapsulation on drop impact resistance of products was discussed. An analytical method for evaluating component encapsulation failure was proposed based on maximum stress on Von Mises and life prediction model. Drop tests were carried out for different encapsulation modes of components. The results show that the simulation results of drop impact of in-situ protective devices were basically consistent with the experimental data. The accuracy of failure analysis method for component encapsulation is verified, providing theoretical support for inferring product reliability.
Keywords:in-situ protection device  drop impact  reliability  FEM
本文献已被 万方数据 等数据库收录!
点击此处可从《包装工程》浏览原始摘要信息
点击此处可从《包装工程》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号