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Single nanoparticle semiconductor devices
Authors:Yongping Ding Ying Dong Bapat   A. Nowak   J.D. Carter   C.B. Kortshagen   U.R. Campbell   S.A.
Affiliation:Dept. of Electr. & Comput. Eng., Minnesota Univ., USA;
Abstract:
Using a new technique in forming the cubic single-crystal silicon nanoparticles that are about 40 nm on a side, the authors have demonstrated a vertical-flow surround-gate Schottky-barrier transistor. This approach allows the use of well-known approaches to surface passivation and contact formation within the context of deposited single-crystal materials for device applications. It opens the door to the novel three-dimensional integrated circuits and new approaches to hyper integration. The fabrication process involves successive deposition and planarization and does not require nonoptical lithography. Device characteristics show reasonable turn-off characteristics and on-current densities of more than 10/sup 7/ A/cm/sup 2/.
Keywords:
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