Single nanoparticle semiconductor devices |
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Authors: | Yongping Ding Ying Dong Bapat A. Nowak J.D. Carter C.B. Kortshagen U.R. Campbell S.A. |
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Affiliation: | Dept. of Electr. & Comput. Eng., Minnesota Univ., USA; |
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Abstract: | ![]() Using a new technique in forming the cubic single-crystal silicon nanoparticles that are about 40 nm on a side, the authors have demonstrated a vertical-flow surround-gate Schottky-barrier transistor. This approach allows the use of well-known approaches to surface passivation and contact formation within the context of deposited single-crystal materials for device applications. It opens the door to the novel three-dimensional integrated circuits and new approaches to hyper integration. The fabrication process involves successive deposition and planarization and does not require nonoptical lithography. Device characteristics show reasonable turn-off characteristics and on-current densities of more than 10/sup 7/ A/cm/sup 2/. |
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