Crystallographic electron microscopy

We present a family of techniques for the transmission electron microscope that generate surface zone-axis patterns. These patterns display the variation of the diffracted-beam intensity as a function of the angle of the incident electrons. The conditions of the experiments are those of reflection high-energy electron diffraction at near grazing incidence. The techniques are: surface convergent-beam diffraction, a surface analogue of the Tanaka method and a modified double-rocking scheme. Experimental results are presented for diffraction from surfaces of MgO and MoS₂. We anticipate that surface zone-axis patterns (surface ZAPs) will become established as an important tool for surface characterization, especially when used in conjunction with high-resolution surface imaging and surface energy loss spectroscopy; surface ZAPs may be expected to play, in surface analysis, a role analogous to that played by convergent-beam diffraction in normal transmission electron microscopy.