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全固态相控阵三坐标雷达机内测试设计
引用本文:雷旺敏.全固态相控阵三坐标雷达机内测试设计[J].现代雷达,1999,21(4):19-25.
作者姓名:雷旺敏
作者单位:南京电子技术研究所,南京,210013
摘    要:介绍了全固态相控阵三坐标雷达机内测试系统设计方法和各分系统 B I T 设计特点,强调了 B I T 系统模块化设计的重要性,强调了建立可更换单元备份件数据库和故障列表显示的必要性。

关 键 词:机内测试  机内测试设备  故障检测  故障隔离

Design of BIT System in the FullSolid-State Phased Array 3D Radar
Lei Wangming.Design of BIT System in the FullSolid-State Phased Array 3D Radar[J].Modern Radar,1999,21(4):19-25.
Authors:Lei Wangming
Affiliation:Nanjing Research Institute of Electronics Technology Nanjing 210013
Abstract:The design method of BIT system in the full solid-state phased array 3D radar and design features of BIT in subsystems are introduced in this paper. Emphases are put on the importance of modular design in BIT system.The necessity to design data bank for LRU and fault tabular display is also emphasized.
Keywords:built-in-test(BIT)  built-in-test equipment(BITE)  fault detection  fault isolation
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