Characterization of diffusion induced grain boundary migration in the Ag/Cu system |
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| Affiliation: | 1. Instituto Superior Técnico, ICEMS, Universidade de Lisboa, Av. Rovisco Pais, 1049-001 Lisboa, Portugal;2. INEGI, Campus da FEUP, Rua Dr. Roberto Frias, 400 4200-465 Porto, Portugal;3. FEUP, Rua Dr. Roberto Frias 4200-465 Porto, Portugal;1. Department of Materials Engineering, Tehran Science and Research Branch, Islamic Azad University, Tehran 50122, Iran;2. School of Metallurgy and Materials Engineering, University of Tehran, Tehran, 50122, Iran;1. M.V. Lomonosov Moscow State University, Leninskie gori, Moscow 119991, Russia;2. Department of Physics, Gebze Technical University, Gebze, 41400 Kocaeli, Turkey;3. A.M. Prokhorov General Physics Institute, Vavilova St., 38, Moscow 119991, Russia;1. Institute of Materials Science, Dresden University of Technology, Helmholtzstraße 7, D-01069 Dresden, Germany;2. Leibniz Institute for Solid State and Materials Research, Helmholtzstraße 20, D-01069 Dresden, Germany;3. Fraunhofer Institute for Material and Beam Technology, Winterbergstraße 28, D-01277 Dresden, Germany |
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| Abstract: | ![]()
The phenomenon of diffusion induced grain boundary migration (DIGM) when silver diffuses along copper's grain boundaries was confirmed through the characterization of the microstructure and the morphology of the migrated boundaries, the discontinuity and asymmetric character of the concentration profile, the dislocation configuration and the kinetics of migration by means of SEM, EPMA, TEM and AEM. The experimental results were discussed to prove the existence and the characteristics of DIGM in Ag/Cu system. |
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