Electron field emission from defective diamond films deposited on chrome electrode |
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| Affiliation: | 1. Department of Molecular Science and Technology, Ajou University, 5 Wonchun-dong, Paldal-ku, Suwon 442-749, South Korea;2. Department of Physics, Ajou University, 5 Wonchun-dong, Paldal-ku, Suwon 442-749, South Korea;1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, ROC;2. Materials Science Center, National Tsing Hua University, Hsinchu 300, Taiwan, ROC;3. Department of Engineering and System Science, National Tsing Hua University, Hsinchu 300, Taiwan, ROC;1. College of Applied Mathematics and Physics, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing 100022, PR China;2. Department of Molecular Science and Technology, Ajou University, Suwon 442-749, Republic of Korea;3. College of Materials Science and Engineering, Chongqing University, Chongqing 400044, PR China;4. Quantum Materials Laboratory, Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing 100022, PR China;1. College of Applied Mathematics and Physics, Beijing University of Technology, No. 100, Pingleyuan, Chaoyang District, Beijing 100022, PR China;2. The Key Laboratory of Advanced Functional Materials of China Education Ministry, Beijing University of Technology, No.100, Pingleyuan, Chaoyang District, PR China;3. Department of Molecular Science and Technology, Ajou University, Suwon 442-749, Republic of Korea |
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| Abstract: | ![]()
Deposition of the good electron-emitting diamond films on a chrome electrode, which is essential for the development of the actual display device, was successfully carried out. Emission current densities of 1 μA/cm2 and 1 mA/cm2 were measured at the electric field of 6.6 and 12.3 V/μm, respectively. The emission images revealed that the emission site density was ∼104 sites/cm2. Both Raman spectroscopy and scanning electron microscopy showed that these were defective diamond films, similar to those deposited on silicon substrates under similar deposition conditions. Comparing the emission characteristics of the films deposited on silicon and on chrome, we conclude that the interface between the back contact and the film is not the current-limiting factor. Moreover, we discuss the importance of the inclusion of sp2-bonded carbons for good electron emission. |
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